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  • CIS
    Members: Free
    IEEE Members: Free
    Non-members: Free
    Duration: 00:11:13
20 Jul 2022

Thanks to convergence of computing power, ubiquitous sensor data
measurements and new algorithm, Artificial Intelligence is powering new
wave of industrial revolution.
In the presentation we will present
how AI enabled embedded devices are shortening production testing time
by 75%, increasing quality and allowing 50% energy saving.
How we can
achieve this type performance ? Changing the testing analysis approach
from steady state analysis to transient analysis thanks.
The presentation will cover general principle and an applied case study.

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